In order to determine the best traits related to indirect increasing of grain yield, five wheat genotypes (Zagros, Tajan, Durum cul., Kohdasht and N-81-18 line) were evaluated by using randomized complete block design (RCBD) with 4 replications in research field of Gorgan University of Agricultural Sciences and Natural Recourses. The studied traits included leaf area index (LAI), crop growth rate (CGR), relative growth rate (RGR), net assimilation rate (NAR), number of tiller, number of spike per plant, number of grain per spike, spike weight, grain weight, biological yield, harvest index and grain yield. The most grain yield was belonged to N-81-18 line. This line showed most number of grain per spike and spike weight in comparison with other genotypes. The results showed, there was significant correlation between grain yield and harvest index in all genotypes. The results of path analysis showed spike weight had the most direct effect on grain yield, in most genotype. Among of growth indices LAI had most negative direct effect, since correlation between leaf area and grain yield was significantly positive; therefore, the last correlation should be via indirect effect.
Navabpour, S., & Kazemi, G. (2013). Study the relations between grain yield
and related traits in wheat by path analysis. Journal of Crop Production, 6(1), 191-203.
MLA
S. Navabpour; G. Kazemi. "Study the relations between grain yield
and related traits in wheat by path analysis". Journal of Crop Production, 6, 1, 2013, 191-203.
HARVARD
Navabpour, S., Kazemi, G. (2013). 'Study the relations between grain yield
and related traits in wheat by path analysis', Journal of Crop Production, 6(1), pp. 191-203.
VANCOUVER
Navabpour, S., Kazemi, G. Study the relations between grain yield
and related traits in wheat by path analysis. Journal of Crop Production, 2013; 6(1): 191-203.
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